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Estimation of Defects Based on Defect Decay Model: ED^{3}M.
Syed Waseem Haider
João W. Cangussu
Kendra M. L. Cooper
Ram Dantu
Syed Haider
Published in:
IEEE Trans. Software Eng. (2008)
Keyphrases
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neural network
formal model
objective function
probabilistic model
management system
theoretical analysis
computational model
statistical model
prediction model
real time
artificial neural networks
cost function
probability distribution
experimental data
conceptual model
estimation process