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Multi-Port 1R1W Transpose Magnetic Random Access Memory by Hierarchical Bit-Line Switching.

Liang ChangZhaohao WangYouguang ZhangWeisheng Zhao
Published in: IEEE Access (2019)
Keyphrases
  • random access memory
  • design considerations
  • low voltage
  • memory access
  • flash memory
  • embedded dram
  • databases