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EBL: Efficient background learning for x-ray security inspection.

Wei WangLinyang HeYiqing LiKai ZhouLinchao LiGuohua ChengTing Wen
Published in: Appl. Intell. (2023)
Keyphrases
  • x ray
  • three dimensional
  • explanation based learning
  • intraoperative
  • x ray images
  • macro operators
  • digital x ray images
  • medical imaging
  • ct scans
  • dual energy
  • mutual information
  • image quality
  • tomographic images