A method for fast simulation of multiple catastrophic faults in analogue circuits.

Michal Tadeusiewicz Stanislaw Halgas

Published in: Int. J. Circuit Theory Appl. (2010)

Keyphrases

significant improvement
experimental evaluation
high precision
preprocessing
prior knowledge
probabilistic model
data sets
neural network
image processing
decision trees
support vector machine
denoising
support vector machine svm
optimization algorithm
synthetic data
classification method