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A PVT resilient short-time measurement solution for on-chip testing.
Esrafil Jedari
Rashid Rashidzadeh
Mehrdad Saif
Published in:
Microelectron. J. (2018)
Keyphrases
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high speed
database
real time
neural network
case study
linear programming
closed form
information systems
decision trees
optimal solution
solution space
integer programming