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A PVT resilient short-time measurement solution for on-chip testing.

Esrafil JedariRashid RashidzadehMehrdad Saif
Published in: Microelectron. J. (2018)
Keyphrases
  • high speed
  • database
  • real time
  • neural network
  • case study
  • linear programming
  • closed form
  • information systems
  • decision trees
  • optimal solution
  • solution space
  • integer programming