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A general on-wafer noise figure de-embedding technique with gain uncertainty analysis.

Shukri Korakkottil Kunhi MohdTun Zainal Azni ZulkifliOthman Sidek
Published in: IEICE Electron. Express (2010)
Keyphrases
  • special case
  • database
  • learning algorithm
  • noisy data
  • signal to noise ratio
  • noise model
  • real time
  • genetic algorithm
  • artificial intelligence
  • data analysis
  • closely related
  • noise reduction
  • noise level
  • measurement noise