Wafer Defect Localization and Classification Using Deep Learning Techniques.
Prashant P. ShindePriyadarshini P. PaiShashishekar P. AdigaPublished in: IEEE Access (2022)
Keyphrases
- deep learning
- unsupervised learning
- machine learning
- support vector
- feature vectors
- restricted boltzmann machine
- decision trees
- unsupervised feature learning
- text classification
- feature extraction
- image classification
- support vector machine
- weakly supervised
- feature selection
- information extraction
- domain specific
- high dimensional
- data sets