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Gate Sizing Under Uncertainty.

Nathaniel A. ConosSaro MeguerdichianMiodrag Potkonjak
Published in: VLSI-SoC (Selected Papers) (2013)
Keyphrases
  • computer vision
  • uncertain data
  • inherent uncertainty
  • databases
  • search algorithm
  • multiresolution
  • high resolution
  • control system
  • possibility theory
  • cmos technology
  • nano scale