A robust -40 to 120°C all-digital true random number generator in 40nm CMOS.

Kaiyuan Yang David T. Blaauw Dennis Sylvester

Published in: VLSIC (2015)

Keyphrases

random number generator
high speed
circuit design
metal oxide semiconductor
low cost
random number
real time
data sets
cost effective
power consumption
digital content
cmos technology