ECRA Vol. 5. No. 1.

Norman M. Sadeh Jae Kyu Lee Robert J. Kauffman René W. Wagenaar

Published in: Electron. Commer. Res. Appl. (2006)

Keyphrases

machine intelligence
signal processing
ai edam
special issue
ieee trans
pattern recognition
data mining
genetic algorithm
image processing
lecture notes
artificial intelligence
evolutionary algorithm
rough sets
soft computing