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Input Noise in 22 nm FinFET CMOS.
Saeid Daneshgar
Hao Li
Taehwan Kim
Ganesh Balamurugan
Published in:
IEEE J. Solid State Circuits (2022)
Keyphrases
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input data
noise level
power consumption
noisy data
high speed
missing data
random noise
image structure
noise model
nm technology
cmos technology
low signal to noise ratio
signal to noise ratio
low cost
noise removal
user input
median filter
image noise
image processing
statistically independent
data sets