Input Noise in 22 nm FinFET CMOS.

Saeid Daneshgar Hao Li Taehwan Kim Ganesh Balamurugan

Published in: IEEE J. Solid State Circuits (2022)

Keyphrases

input data
noise level
power consumption
noisy data
high speed
missing data
random noise
image structure
noise model
nm technology
cmos technology
low signal to noise ratio
signal to noise ratio
low cost
noise removal
user input
median filter
image noise
image processing
statistically independent
data sets