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A General Method to Accurately Measure the Thin-Film Sheet Resistance for Sensors.

Xingyi WuYijie DaiChen FuXiaobo ZhuWenhua GuDaying SunWen WuXiaodong HuangZhongxiang Shen
Published in: IEEE Trans. Instrum. Meas. (2021)
Keyphrases
  • database
  • similarity measure
  • correlation coefficient
  • thin film
  • expert systems
  • sensor networks
  • decision makers
  • multi view
  • multi layer