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A General Method to Accurately Measure the Thin-Film Sheet Resistance for Sensors.
Xingyi Wu
Yijie Dai
Chen Fu
Xiaobo Zhu
Wenhua Gu
Daying Sun
Wen Wu
Xiaodong Huang
Zhongxiang Shen
Published in:
IEEE Trans. Instrum. Meas. (2021)
Keyphrases
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database
similarity measure
correlation coefficient
thin film
expert systems
sensor networks
decision makers
multi view
multi layer