Can high-order dependencies improve mutual information based feature selection?
Xuan Vinh NguyenShuo ZhouJeffrey ChanJames BaileyPublished in: Pattern Recognit. (2016)
Keyphrases
- high order
- feature selection
- higher order
- mutual information
- low order
- tensor analysis
- pairwise
- bayesian logistic regression
- lower order
- machine learning
- markov random field
- image registration
- dimensionality reduction
- low rank
- zernike moments
- feature extraction
- text categorization
- multi task learning
- semi supervised
- fourth order