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Workshop-Seminare mit CSCW-Unterstützung.

Johannes BusseDetlev Krause
Published in: D-CSCL (2000)
Keyphrases
  • test set
  • databases
  • machine learning
  • selected papers
  • invited paper
  • panel discussion
  • acm sigkdd
  • multiscale
  • computer science
  • error rate
  • computer supported