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Channel Models for Multi-Level Cell Flash Memories Based on Empirical Error Analysis.

Veeresh TaranalliHironori UchikawaPaul H. Siegel
Published in: IEEE Trans. Commun. (2016)
Keyphrases
  • error analysis
  • least squares
  • machine learning
  • probabilistic model
  • model selection
  • cross ratio
  • neural network
  • computational models
  • multi channel
  • empirical data
  • analytical models