on Si(0 0 1) using interface engineering.

C. Merckling G. Delhaye M. El-Kazzi S. Gaillard Y. Rozier L. Rapenne B. Chenevier O. Marty G. Saint-Girons M. Gendry Y. Robach G. Hollinger

Published in: Microelectron. Reliab. (2007)

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