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Image-guided structure-constrained inversion of electrical resistivity data for improving contaminations characterization.
Xinmin Ma
Jieyi Zhou
Jing Li
Jiaming Zhang
Chunmei Han
Lili Guo
Shupeng Li
Deqiang Mao
Published in:
Comput. Geosci. (2024)
Keyphrases
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image guided
machine learning
image processing
high quality
data sources
image data
fully automatic
minimally invasive