LASIC: Layout Analysis for Systematic IC-Defect Identification Using Clustering.
Wing Chiu Jason TamRonald Shawn BlantonPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2015)
Keyphrases
- clustering algorithm
- clustering method
- spectral clustering
- self organizing maps
- databases
- hierarchical clustering
- data points
- unsupervised learning
- cluster analysis
- machine learning
- categorical data
- graph theoretic
- automatic identification
- parameter free
- k means
- image processing
- computer vision
- data sets
- qualitative and quantitative