Error Rate-Based Wear-Leveling for nand Flash Memory at Highly Scaled Technology Nodes.
Yangyang PanGuiqiang DongTong ZhangPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2013)
Keyphrases
- error rate
- flash memory
- storage devices
- solid state
- file system
- garbage collection
- main memory
- random access
- test set
- embedded systems
- disk drives
- b tree
- database systems
- personal computer
- small size
- hand held devices
- lower error rates
- data storage
- storage systems
- multi dimensional
- management system
- case study
- misclassification rate
- low cost
- software engineering
- data structure
- word error rate
- databases
- data sets