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Modeling and mitigating NBTI in nanoscale circuits.

Seyab KhanSaid Hamdioui
Published in: IOLTS (2011)
Keyphrases
  • information systems
  • artificial neural networks
  • databases
  • data mining
  • computer vision
  • feature selection
  • bayesian networks
  • multiresolution
  • risk management
  • modeling language
  • modeling framework