Affordable High Throughput Field Detection of Wheat Stripe Rust Using Deep Learning with Semi-Automated Image Labeling.
Zhou TangMeinan WangMichael SchirrmannKarl-Heinz DammerXianran LiRobert BrueggemanSindhuja SankaranArron H. CarterMichael O. PumphreyYang HuXianming ChenZhiwu ZhangPublished in: Comput. Electron. Agric. (2023)
Keyphrases
- high throughput
- semi automated
- deep learning
- image labeling
- fully automated
- microarray
- unsupervised learning
- structured prediction
- conditional random fields
- data acquisition
- fully automatic
- machine learning
- object detection
- mental models
- weakly supervised
- information extraction
- image segmentation
- computer vision
- crf model
- information retrieval