Fault isolation in semiconductor product, process, physical and package failure analysis: Importance and overview.
Jiann Min ChinVinod NarangXiaole ZhaoMeng Yeow TayAngeline PhoaVenkat RavikumarLwin Hnin EiSoon Huat LimChea Wei TeoSyahirah ZulkifliMei Chyn OngMing Chuan TanPublished in: Microelectron. Reliab. (2011)