A stochastic V2V LOS/NLOS model using neural networks for hardware-in-the-loop testing.
Christina StadlerXenia FlammThomas GruberAnatoli DjanatlievReinhard GermanDavid EckhoffPublished in: VNC (2017)
Keyphrases
- neural network
- computational model
- probabilistic model
- stochastic model
- neural network model
- mathematical model
- pattern recognition
- data sets
- formal model
- statistical model
- theoretical framework
- management system
- cost function
- artificial neural networks
- objective function
- high level
- experimental data
- metadata
- e learning
- prediction model
- multi layer
- real time