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Extended depth-of-field using adjacent plane deblurring and MPP wavelet fusion for microscope images.

Hyohoon ChoiSamuel ChengQiang WuKenneth R. CastlemanAlan C. Bovik
Published in: ISBI (2006)
Keyphrases
  • microscope images
  • denoising
  • multiscale
  • image processing
  • multiresolution
  • wavelet coefficients
  • computer vision
  • feature extraction
  • wavelet transform
  • image restoration
  • image denoising
  • cross sections