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Considerations for On-Wafer Millimeter-Wave Measurements on Thin Ceramic Substrate.

Djilali HammouTarek DjerafiMourad NedilSerioja Ovidiu Tatu
Published in: IEEE Trans. Instrum. Meas. (2016)
Keyphrases
  • millimeter wave
  • radar images
  • physical phenomena
  • imaging process
  • sar imagery
  • multiscale
  • computer vision
  • imaging systems
  • automatic target recognition