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Using the Boundary Scan Delay Chain for Cross-Chip Delay Measurement and Characterization of Delay Modeling Flow.

Josef SchmidTimo SchüringChristoph Smalla
Published in: ISQED (2001)
Keyphrases
  • high speed
  • power dissipation
  • critical path
  • data mining
  • image processing
  • real time
  • information retrieval
  • response time
  • processor sharing