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Investigation of IGBT turn-on failure under high applied voltage operation.
Masayasu Ishiko
Koji Hotta
Sachiko Kawaji
Takahide Sugiyama
Tomoyuki Shouji
Takeshi Fukami
Kimimori Hamada
Published in:
Microelectron. Reliab. (2004)
Keyphrases
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wide range
neural network
real world