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Investigation of IGBT turn-on failure under high applied voltage operation.

Masayasu IshikoKoji HottaSachiko KawajiTakahide SugiyamaTomoyuki ShoujiTakeshi FukamiKimimori Hamada
Published in: Microelectron. Reliab. (2004)
Keyphrases
  • wide range
  • neural network
  • real world