A Highly Reliable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source.
Bohan LinYachuan PangBin GaoJianshi TangDong WuTing-Wei ChangWei-En LinXiaoyu SunShimeng YuMeng-Fan ChangHe QianHuaqiang WuPublished in: IEEE J. Solid State Circuits (2021)