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A Highly Reliable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source.

Bohan LinYachuan PangBin GaoJianshi TangDong WuTing-Wei ChangWei-En LinXiaoyu SunShimeng YuMeng-Fan ChangHe QianHuaqiang Wu
Published in: IEEE J. Solid State Circuits (2021)
Keyphrases
  • highly reliable
  • information retrieval
  • decision making
  • three dimensional
  • data mining
  • machine learning
  • web services
  • relational databases
  • shortest path
  • process model
  • development process