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Introduction to special issue on reliability and device degradation in emerging technologies.
Rahul Rao
Fadi H. Gebara
Published in:
ACM J. Emerg. Technol. Comput. Syst. (2014)
Keyphrases
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special issue
emerging technologies
ai edam
ecml pkdd
mobile learning
international journal
user experience
e learning
applied intelligence
learning technologies
special section
knowledge society
learning experience