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Robust Estimators and Test Statistics for One-Shot Device Testing Under the Exponential Distribution.

Narayanaswamy BalakrishnanElena CastillaNirian MartínLeandro Pardo
Published in: IEEE Trans. Inf. Theory (2019)
Keyphrases
  • test statistic
  • robust estimators
  • confidence intervals
  • robust estimation
  • polynomial approximation
  • multiscale
  • least squares
  • maximum likelihood
  • test set
  • structured light