Deconvolution of 3D fluorescence micrographs with automatic risk minimization.

Sathish Ramani Cédric Vonesch Michael Unser

Published in: ISBI (2008)

Keyphrases

risk minimization
loss function
empirical risk
least squares
line search
uniform convergence
generalization error
image restoration
hinge loss
decision trees
multi class
denoising
motion blur
blind deconvolution
multi category