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Deconvolution of 3D fluorescence micrographs with automatic risk minimization.
Sathish Ramani
Cédric Vonesch
Michael Unser
Published in:
ISBI (2008)
Keyphrases
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risk minimization
loss function
empirical risk
least squares
line search
uniform convergence
generalization error
image restoration
hinge loss
decision trees
multi class
denoising
motion blur
blind deconvolution
multi category