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Thin Films by the Sputtering Method under Different Deposition Parameters.
Kun-Neng Chen
Chao-Ming Hsu
Jing Liu
Yu-Chen Liou
Cheng-Fu Yang
Published in:
Micromachines (2016)
Keyphrases
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thin film
database
sensitivity analysis
fine tuning
neural network
learning algorithm
objective function
significant improvement
detection method
parameter space