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Electrical modeling of tapered TSV including MOS-Field effect and substrate parasitics: Analysis and application.

Amira NabilJose A. BernardoYue MaMohamed AbouelattaAhmed ShakerLatifa Fakri-BouchetHani F. RagaiChristian Gontrand
Published in: Microelectron. J. (2020)
Keyphrases
  • data analysis
  • real time
  • data mining
  • statistical analysis
  • finite element
  • modeling method
  • colored petri nets