A System for Measuring Surface Facet Orientation from Atomic Force Microscope Data.
John G. HagedornHolly E. RushmeierJohn BlendellMark VaudinPublished in: IEEE Visualization (1996)
Keyphrases
- data sets
- data analysis
- data structure
- database
- data collection
- data sources
- original data
- computer systems
- data processing
- synthetic data
- training data
- raw data
- knowledge discovery
- small number
- neural network
- high dimensional data
- spatial data
- complex data
- data quality
- data mining techniques
- image data
- data points
- end users
- high dimensional
- learning algorithm