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Pretest Gap Mura on TFT LCDs Using the Optical Interference Pattern Sensing Method and Neural Network Classification.
Tung-Yen Li
Jang-Zern Tsai
Rong-Seng Chang
Li-Wei Ho
Ching-Fu Yang
Published in:
IEEE Trans. Ind. Electron. (2013)
Keyphrases
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neural network
support vector machine
classification method
preprocessing
classification accuracy
support vector
support vector machine svm
feature selection
liquid crystal displays
feature extraction
computational complexity
training process