Technical Invention Trend Analysis of Applicants Based on CPC Classification.

Jiyee Jeon Soohyeon Chae Jangwon Gim

Published in: ICWE Workshops (2019)

Keyphrases

trend analysis
decision trees
pattern recognition
machine learning
feature extraction
supervised learning
data mining
support vector
training set
text classification
feature space
data sources
image classification
unsupervised learning