Wafer Map Defect Patterns Semi-Supervised Classification Using Latent Vector Representation.
Qiyu WeiWei ZhaoXiaoyan ZhengZeng ZengPublished in: CIS-RAM (2023)
Keyphrases
- semi supervised classification
- vector representation
- semi supervised learning
- semi supervised
- labeled data
- fixed length
- data sets
- similarity computation
- similarity measure
- unlabeled data
- document representation
- supervised learning
- pairwise constraints
- keywords
- probabilistic model
- vector space
- search engine
- machine learning