Login / Signup
Guest Editorial Special Issue on the 2015 IEEE International Instrumentation and Measurement Technology Conference Pisa, Italy, May 11-14, 2015.
Shervin Shirmohammadi
Pasquale Daponte
Wendy Van Moer
Published in:
IEEE Trans. Instrum. Meas. (2016)
Keyphrases
</>
special issue
ai edam
ecml pkdd
international journal
special section
applied intelligence
data acquisition
artificial intelligence
databases and information systems
ultra wide band
information systems
world wide
san diego
papers included