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SRAM stability design comprehending 14nm FinFET reliability.

Choelhwyi BaeSangwoo PaeCheong-sik YuKangjung KimYongshik KimJongwoo Park
Published in: IRPS (2015)
Keyphrases
  • computer aided
  • user interface
  • design decisions
  • data sets
  • expert systems
  • evolutionary algorithm
  • sufficient conditions
  • engineering design
  • optimal design