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Failure mechanisms of pure silver, pure aluminum and silver-aluminum alloy under high current stress.

E. MisraN. D. TheodoreJ. W. MayerT. L. Alford
Published in: Microelectron. Reliab. (2006)
Keyphrases
  • thin film
  • feed rate
  • genetic algorithm
  • search algorithm
  • real world
  • artificial intelligence
  • knowledge base
  • stress distribution