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A new model for thermal channel noise of deep-submicron MOSFETs and its application in RF-CMOS design.
Gerhard Knoblinger
Peter Klein
Marc Tiebout
Published in:
IEEE J. Solid State Circuits (2001)
Keyphrases
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computational model
high level
management system
mathematical model
conceptual model
user interface
probabilistic model
experimental data
case study
denoising
input data
digital camera
metamodel