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Low energy single event upset/single event transient-tolerant latch for deep subMicron technologies.

Mahdi FazeliSeyed Ghassem MiremadiAlireza EjlaliAhmad Patooghy
Published in: IET Comput. Digit. Tech. (2009)
Keyphrases
  • low energy
  • neural network
  • data streams
  • data sets
  • three dimensional