Scanning the issue - special issue on flat-panel display technology.

Babu Chalamala Frank E. Libsch Robert H. Reuss Bruce E. Gnade

Published in: Proc. IEEE (2002)

Keyphrases

special issue
international journal
ai edam
ecml pkdd
applied intelligence
case study
special section
cost effective
data processing
rapid development
key technologies
real time
databases
machine learning
artificial intelligence
scan data