Locating Several Small Inclusions in Impedance Tomography from Backscatter Data.

Published in: SIAM J. Numer. Anal. (2011)

Keyphrases

data sets
database
small number
data processing
data analysis
data structure
data points
image data
high quality
data collection
synthetic data
raw data
complex data
prior knowledge
statistical analysis
experimental data
data distribution
feature selection
machine learning
image reconstruction