On-Chip Combined C-V/I-V Characterization System in 45-nm CMOS Technology.

Simeon Realov Kenneth L. Shepard

Published in: IEEE J. Solid State Circuits (2013)

Keyphrases

cmos technology
low power
power consumption
low voltage
spl times
parallel processing
mixed signal
image sensor
power dissipation
high speed
silicon on insulator
low cost
cmos image sensor
image processing
embedded dram
video camera