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Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation.

Tommaso CilentoChan-Su YunArsen TerterianChang Hwi LeeJung Eon MoonSi Woo LeeHyoungcheol KwonManho SeungSeokkiu Lee
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • computer simulation
  • database
  • computational complexity
  • multiresolution
  • data sets
  • social networks
  • website
  • multi view
  • simulation study
  • memory requirements
  • simulation models
  • layout design
  • light emitting