An Evaluation of the Oak Ridge National Laboratory Cray XT3.
Sadaf R. AlamRichard F. BarrettMark R. FaheyJeffery A. KuehnO. E. Bronson MesserRichard Tran MillsPhilip C. RothJeffrey S. VetterPatrick H. WorleyPublished in: Int. J. High Perform. Comput. Appl. (2008)