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Fast identification of short, linear perfectly conducting cracks in a bistatic measurement configuration.
Sangwoo Kang
Mikyoung Lim
Won-Kwang Park
Published in:
J. Comput. Phys. (2022)
Keyphrases
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fourier transform
digital images
measurement errors
linear systems
optimal configuration
image processing
optical flow
data acquisition
closed form
automatic identification
configuration space