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A Novel Model of the Aging Effect on the ON-State Resistance of SiC Power MOSFETs for High-Accuracy Package-Related Aging Evaluation.
Qinghao Zhang
Pinjia Zhang
Published in:
IEEE Trans. Ind. Electron. (2023)
Keyphrases
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high accuracy
high level
probabilistic model
computational model
evaluation method
information retrieval
neural network
prediction model
prior knowledge
management system
evaluation model
statistical model
theoretical framework
state space
multiscale
similarity measure
genetic algorithm