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Symmetric Block-Wise Concatenated BCH Codes for NAND Flash Memories.

Daesung KimKrishna R. NarayananJeongseok Ha
Published in: IEEE Trans. Commun. (2018)
Keyphrases
  • block wise
  • reed solomon
  • error correction
  • order statistics
  • feature vectors
  • error control
  • bi level
  • flash memory
  • image processing
  • video sequences
  • digital images